PAPERS

Title:Test-Case Generation for Embedded Simulink via Formal Concept Analysis
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Authors:Nannan He
Philipp Rümmer
Daniel Kroening EMail
Remarks:
Topics:

Bibtex:

@inproceedings{hrk2011-dac,
  AUTHOR    = { He, Nannan
                and R{\"u}mmer, Philipp
                and Kroening, Daniel },
  TITLE     = { Test-Case Generation for Embedded {Simulink} via Formal Concept Analysis },
  BOOKTITLE = { Design Automation Conference (DAC) },
  YEAR      = { 2011 },
  PUBLISHER = { ACM },
  PAGES     = { 224--229 },
  ISBN      = { 978-1-4503-0636-2 },
}

We welcome feedback and comments at kroening@cs.cmu.edu.
Last modified by Daniel Kröning.