PAPERS

Title:Structural Test Coverage Criteria for Deep Neural Networks
Links:Document as PDF
Authors:Youcheng Sun
Xiaowei Huang
Daniel Kroening EMail
James Sharp
Matthew Hill
Rob Ashmore
Remarks:
Topics:

Bibtex:

@article{shksha2019-emsoft,
  AUTHOR    = { Sun, Youcheng 
                and Huang, Xiaowei
                and Kroening, Daniel
                and Sharp, James
                and Hill, Matthew
                and Ashmore, Rob },
  TITLE     = { Structural Test Coverage Criteria for Deep Neural Networks  },
  NOTE      = { To be presented at the International Conference on Embedded Software (EMSOFT) 2019 },
  YEAR      = { 2019 },
  JOURNAL   = { ACM Transactions on Embedded Computing Systems (TECS) },
}

We welcome feedback and comments at kroening@cs.cmu.edu.
Last modified by Daniel Kröning.