| Title: | Explaining Image Classifiers using Statistical Fault Localization |
|---|---|
| Links: | Homepage Document as PDF |
| Authors: | Youcheng Sun |
| Hana Chockler | |
| Xiaowei Huang | |
| Daniel Kroening EMail | |
| Remarks: | |
| Topics: |
Bibtex:
@inproceedings{schk2020,
AUTHOR = { Sun, Youcheng
and Chockler, Hana
and Huang, Xiaowei
and Kroening, Daniel },
TITLE = { Explaining Image Classifiers using Statistical Fault Localization },
BOOKTITLE = { European Conference on Computer Vision (ECCV) },
YEAR = { 2020 },
PUBLISHER = { Springer },
PAGES = { 391--406 },
SERIES = { LNCS },
VOLUME = { 12373 },
}
We welcome feedback and comments at
kroening@cs.cmu.edu.
Last modified by Daniel Kröning.